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$57.30
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EBIC Necktie
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EBIC Necktie
For your failure analyst or semiconductor process engineer, electrical engineer, or any geek friends. This is Electron Beam Induced Current image of a 7 nm SRAM. Amaze your friends! Find defects and map current flows in advanced technology!
Customer Reviews
4.5 out of 5 stars rating2.4K Total Reviews
2,354 Reviews
Reviews for similar products
5 out of 5 stars rating
By Libby L.14 July 2017 • Verified Purchase
Tie
Zazzle Reviewer Program
Product was of good quality. The fabric is excellent
5 out of 5 stars rating
By Janette C.28 February 2016 • Verified Purchase
Tie
Zazzle Reviewer Program
Beautiful material, and finish.
Smart tie for a special birthday, my Dads 80th.
Will look smashing with a nice suit. Printing excellent nice and clear.
5 out of 5 stars rating
By Libby L.14 July 2017 • Verified Purchase
Tie
Zazzle Reviewer Program
Item is of very good quality. The fabric is excellent
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Product ID: 151177931955441320
Posted on 8/11/2021, 10:18 AM
Rating: G
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